Development of automated neighborhood pattern sensitive faults syndrome generator for static random access memory

Development of automated neighborhood pattern sensitive faults syndrome generator for static random access memory

Testing is one of the main key in advanced semiconductor memory technologies. In the past, memory testing only focuses on fault detection. With the increasing complexity of memory devices, fault diagnosis is becoming very important to locate and identify type of fault. One of the memory faults is N...

Full description

Bibliographic Details
Main Author: Rusli, Julie Roslita
Format: Thesis
Language:English
Published: 2011
Subjects:
Random access memory
Online Access:http://psasir.upm.edu.my/id/eprint/42865/
http://psasir.upm.edu.my/id/eprint/42865/1/FK%202011%20114R.pdf

Similar Items

Similar Items