Fault detection with optimum March Test Algorithm
Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algori...
| Main Authors: | , , , , |
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| Format: | Conference or Workshop Item |
| Published: |
IEEE
2012
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| Online Access: | http://psasir.upm.edu.my/id/eprint/40179/ |
| _version_ | 1848849352519319552 |
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| author | Zakaria, Nor Azura Wan Hasan, Wan Zuha Abdul Halin, Izhal Mohd Sidek, Roslina Wen, Xiaoqing |
| author_facet | Zakaria, Nor Azura Wan Hasan, Wan Zuha Abdul Halin, Izhal Mohd Sidek, Roslina Wen, Xiaoqing |
| author_sort | Zakaria, Nor Azura |
| building | UPM Institutional Repository |
| collection | Online Access |
| description | Integrating a large number of embedded memories in
System-on-Chips (SoC’s) occupies up to more than 70% of the
die size, thus requiring Built-In Self-Test (BIST) with the smallest
possible area overhead. This paper analyzes MATS++(6N),
March C-(10N), March SR(14N), and March CL(12N) test
algorithms and shows that they cannot detect either Write
Disturb Faults (WDFs) or Deceptive Read Destructive Faults
(DRDFs) or both. Therefore to improve fault detection, an
automation program is developed based on sequence operation
(SQ) generation rules. However after solving the undetected
fault, the outcome in term of its detection result of Static Double
Cell Faults using the specified test algorithm especially
Transition Coupling Faults (CFtrs), Write Destructive Coupling
Faults (CFwds), Read Destructive Coupling Faults (CFrds) and
Deceptive Read Destructive Faults (CFdrds) are observed. |
| first_indexed | 2025-11-15T09:49:02Z |
| format | Conference or Workshop Item |
| id | upm-40179 |
| institution | Universiti Putra Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-15T09:49:02Z |
| publishDate | 2012 |
| publisher | IEEE |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | upm-401792015-09-04T07:33:44Z http://psasir.upm.edu.my/id/eprint/40179/ Fault detection with optimum March Test Algorithm Zakaria, Nor Azura Wan Hasan, Wan Zuha Abdul Halin, Izhal Mohd Sidek, Roslina Wen, Xiaoqing Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algorithms and shows that they cannot detect either Write Disturb Faults (WDFs) or Deceptive Read Destructive Faults (DRDFs) or both. Therefore to improve fault detection, an automation program is developed based on sequence operation (SQ) generation rules. However after solving the undetected fault, the outcome in term of its detection result of Static Double Cell Faults using the specified test algorithm especially Transition Coupling Faults (CFtrs), Write Destructive Coupling Faults (CFwds), Read Destructive Coupling Faults (CFrds) and Deceptive Read Destructive Faults (CFdrds) are observed. IEEE 2012 Conference or Workshop Item PeerReviewed Zakaria, Nor Azura and Wan Hasan, Wan Zuha and Abdul Halin, Izhal and Mohd Sidek, Roslina and Wen, Xiaoqing (2012) Fault detection with optimum March Test Algorithm. In: 3rd International Conference on Intelligent System Modelling and Simulation, 8-10 Feb. 2012, Sabah, Malaysia. (pp. 700-704). 10.1109/ISMS.2012.88 |
| spellingShingle | Zakaria, Nor Azura Wan Hasan, Wan Zuha Abdul Halin, Izhal Mohd Sidek, Roslina Wen, Xiaoqing Fault detection with optimum March Test Algorithm |
| title | Fault detection with optimum March Test Algorithm |
| title_full | Fault detection with optimum March Test Algorithm |
| title_fullStr | Fault detection with optimum March Test Algorithm |
| title_full_unstemmed | Fault detection with optimum March Test Algorithm |
| title_short | Fault detection with optimum March Test Algorithm |
| title_sort | fault detection with optimum march test algorithm |
| url | http://psasir.upm.edu.my/id/eprint/40179/ http://psasir.upm.edu.my/id/eprint/40179/ |