12N test procedure for NPSF testing and diagnosis for SRAMs

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12N test procedure for NPSF testing and diagnosis for SRAMs

Testing and diagnosis techniques play a key role in the advance of semiconductor memory technologies. The challenge of failure detection has attracted investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. March algorithms are widely used in S...

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Bibliographic Details
Main Authors:	Rusli, Julie Roslita, Wan Hasan, Wan Zuha, Mohd Sidek, Roslina
Format:	Conference or Workshop Item
Language:	English
Published:	IEEE 2008
Online Access:	http://psasir.upm.edu.my/id/eprint/37750/ http://psasir.upm.edu.my/id/eprint/37750/1/12N%20test%20procedure%20for%20NPSF%20testing%20and%20diagnosis%20for%20SRAMs.pdf

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