Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors

Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors

This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-refl...

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Bibliographic Details
Main Authors: You, Kok Yeow, Abbas, Zulkifly, Abd Malek, Mohd Fareq, Cheng, Ee Meng
Format: Article
Language:English
Published: De Gruyter Open 2014
Online Access:http://psasir.upm.edu.my/id/eprint/34659/
http://psasir.upm.edu.my/id/eprint/34659/1/Non-destructive%20dielectric%20measurements%20and%20calibration%20for%20thin%20materials%20using%20waveguide-coaxial%20adaptors.pdf

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