Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors
This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-refl...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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De Gruyter Open
2014
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| Online Access: | http://psasir.upm.edu.my/id/eprint/34659/ http://psasir.upm.edu.my/id/eprint/34659/1/Non-destructive%20dielectric%20measurements%20and%20calibration%20for%20thin%20materials%20using%20waveguide-coaxial%20adaptors.pdf |
| _version_ | 1848847835412299776 |
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| author | You, Kok Yeow Abbas, Zulkifly Abd Malek, Mohd Fareq Cheng, Ee Meng |
| author_facet | You, Kok Yeow Abbas, Zulkifly Abd Malek, Mohd Fareq Cheng, Ee Meng |
| author_sort | You, Kok Yeow |
| building | UPM Institutional Repository |
| collection | Online Access |
| description | This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-reflect-line (TRL) method. In this study, analogous relationships between the results of OSL calibration and TL calibration were identified. In the OSL calibration method, the theoretical, open-standard values are calculated from quasi-static integral models. The proposed TL calibration procedure is a simple, rapid, broadband approach, and its results were validated by using the OSL calibration method and by comparing the results with the calculated integral admittance. The quasi-static integral models were used to convert the measured reflection coefficients to relative permittivities for the infinite samples and the thin, finite samples. |
| first_indexed | 2025-11-15T09:24:55Z |
| format | Article |
| id | upm-34659 |
| institution | Universiti Putra Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-15T09:24:55Z |
| publishDate | 2014 |
| publisher | De Gruyter Open |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | upm-346592016-08-24T02:46:22Z http://psasir.upm.edu.my/id/eprint/34659/ Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors You, Kok Yeow Abbas, Zulkifly Abd Malek, Mohd Fareq Cheng, Ee Meng This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-reflect-line (TRL) method. In this study, analogous relationships between the results of OSL calibration and TL calibration were identified. In the OSL calibration method, the theoretical, open-standard values are calculated from quasi-static integral models. The proposed TL calibration procedure is a simple, rapid, broadband approach, and its results were validated by using the OSL calibration method and by comparing the results with the calculated integral admittance. The quasi-static integral models were used to convert the measured reflection coefficients to relative permittivities for the infinite samples and the thin, finite samples. De Gruyter Open 2014-03 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/34659/1/Non-destructive%20dielectric%20measurements%20and%20calibration%20for%20thin%20materials%20using%20waveguide-coaxial%20adaptors.pdf You, Kok Yeow and Abbas, Zulkifly and Abd Malek, Mohd Fareq and Cheng, Ee Meng (2014) Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors. Measurement Science Review, 14 (1). pp. 16-24. ISSN 1335-8871 http://www.degruyter.com/view/j/msr.2014.14.issue-1/msr-2014-0003/msr-2014-0003.xml 10.2478/msr-2014-0003 |
| spellingShingle | You, Kok Yeow Abbas, Zulkifly Abd Malek, Mohd Fareq Cheng, Ee Meng Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors |
| title | Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors |
| title_full | Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors |
| title_fullStr | Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors |
| title_full_unstemmed | Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors |
| title_short | Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors |
| title_sort | non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors |
| url | http://psasir.upm.edu.my/id/eprint/34659/ http://psasir.upm.edu.my/id/eprint/34659/ http://psasir.upm.edu.my/id/eprint/34659/ http://psasir.upm.edu.my/id/eprint/34659/1/Non-destructive%20dielectric%20measurements%20and%20calibration%20for%20thin%20materials%20using%20waveguide-coaxial%20adaptors.pdf |