Modeling and measuring dielectric constants for very thin materials using a coaxial probe

Modeling and measuring dielectric constants for very thin materials using a coaxial probe

This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1-0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to...

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Bibliographic Details
Main Authors: You, Kok Yeow, Abbas, Zulkifly, Lee, Chia Yew, Abd Malek, Mohd Fareq, Lee, Kim Yee, Cheng, Ee Meng
Format: Article
Language:English
Published: Radioengineering Society 2014
Online Access:http://psasir.upm.edu.my/id/eprint/34543/
http://psasir.upm.edu.my/id/eprint/34543/1/Modeling%20and%20measuring%20dielectric%20constants%20for%20very%20thin%20materials%20using%20a%20coaxial%20probe.pdf

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