APA (7th ed.) Citation

You, K. Y., Abbas, Z., Lee, C. Y., Abd Malek, M. F., Lee, K. Y., & Cheng, E. M. (2014). Modeling and measuring dielectric constants for very thin materials using a coaxial probe. Radioengineering Society.

Chicago Style (17th ed.) Citation

You, Kok Yeow, Zulkifly Abbas, Chia Yew Lee, Mohd Fareq Abd Malek, Kim Yee Lee, and Ee Meng Cheng. Modeling and Measuring Dielectric Constants for Very Thin Materials Using a Coaxial Probe. Radioengineering Society, 2014.

MLA (9th ed.) Citation

You, Kok Yeow, et al. Modeling and Measuring Dielectric Constants for Very Thin Materials Using a Coaxial Probe. Radioengineering Society, 2014.