Al-Frajat, J. K. K., Flayyih, W. N., Mohd Sidek, R., Samsudin, K., & Rokhani, F. Z. (2015). Area efficient test circuit for library standard cell qualification. IEEE.
Chicago Style (17th ed.) CitationAl-Frajat, Jaafar Khadair Kadam, Wameedh Nazar Flayyih, Roslina Mohd Sidek, Khairulmizam Samsudin, and Fakhrul Zaman Rokhani. Area Efficient Test Circuit for Library Standard Cell Qualification. IEEE, 2015.
MLA (9th ed.) CitationAl-Frajat, Jaafar Khadair Kadam, et al. Area Efficient Test Circuit for Library Standard Cell Qualification. IEEE, 2015.
Warning: These citations may not always be 100% accurate.