Morphological characterization of Cus thin films by atomic force microscopy.

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Morphological characterization of Cus thin films by atomic force microscopy.

The aim of the study was to investigate the influence of solution concentration on the morphological properties of chemically deposited copper sulphide thin films. Atomic force microscopy studies of CuS thin films grown on microscope glass slides at different solution concentrations have been carr...

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Bibliographic Details
Main Authors:	Kassim , Anuar, Ho, Soon Min, Tan, Wee Tee, Lim , Kian Siang, Nagalingam, Saravanan
Format:	Article
Language:	English English
Published:	Maxwell Science Publication 2011
Online Access:	http://psasir.upm.edu.my/id/eprint/24958/ http://psasir.upm.edu.my/id/eprint/24958/1/Morphological%20characterization%20of%20Cus%20thin%20films%20by%20atomic%20force%20microscopy.pdf

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