APA (7th ed.) Citation

Kassim , A., Ho, S. M., Tan, W. T., Lim , K. S., & Nagalingam, S. (2011). Morphological characterization of Cus thin films by atomic force microscopy. Maxwell Science Publication.

Chicago Style (17th ed.) Citation

Kassim , Anuar, Soon Min Ho, Wee Tee Tan, Kian Siang Lim , and Saravanan Nagalingam. Morphological Characterization of Cus Thin Films by Atomic Force Microscopy. Maxwell Science Publication, 2011.

MLA (9th ed.) Citation

Kassim , Anuar, et al. Morphological Characterization of Cus Thin Films by Atomic Force Microscopy. Maxwell Science Publication, 2011.