A procedure of a test pattern generation for CMOS operational amplifier based on the inverting amplifier

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A procedure of a test pattern generation for CMOS operational amplifier based on the inverting amplifier

The microchip, an ultra-small and fragile electrical system is prone to damage either during the fabrication process or during the operation of the device itself. In microchip production, the final products are all identical because a master mold is used for production. This also implies that there...

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Bibliographic Details
Main Authors:	Abdul Halin, Izhal, Suparjo, Bambang Sunaryo, Wan Hasan, Wan Zuha, Wagiran, Rahman, Mohd Sidek, Roslina
Format:	Conference or Workshop Item
Language:	English
Published:	Universiti Putra Malaysia Press 2002
Online Access:	http://psasir.upm.edu.my/id/eprint/18388/ http://psasir.upm.edu.my/id/eprint/18388/1/18388.pdf

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