Fault simulation using MPMSLFSR-based test pattern

This paper presents fault simulation results of ISCAS85 bench-mark circuits using test pattern employing multiple polynomial, multiple seed linear feedback shift register (MPMSLFSR). It has been shown that proper feedback connection and appropriate seed of LFSR produces better fault coverage using l...

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Main Authors: Ali, Md. Liakot, Mohd Sidek, Roslina, Mohd Ali, Mohd Alauddin, Suparjoo, Bambang Sunaryo, Wan Hasan, Wan Zuha
Format: Conference or Workshop Item
Language:English
Published: Universiti Putra Malaysia Press 2002
Online Access:http://psasir.upm.edu.my/id/eprint/18384/
http://psasir.upm.edu.my/id/eprint/18384/1/18384.pdf
_version_ 1848843496540078080
author Ali, Md. Liakot
Mohd Sidek, Roslina
Mohd Ali, Mohd Alauddin
Suparjoo, Bambang Sunaryo
Wan Hasan, Wan Zuha
author_facet Ali, Md. Liakot
Mohd Sidek, Roslina
Mohd Ali, Mohd Alauddin
Suparjoo, Bambang Sunaryo
Wan Hasan, Wan Zuha
author_sort Ali, Md. Liakot
building UPM Institutional Repository
collection Online Access
description This paper presents fault simulation results of ISCAS85 bench-mark circuits using test pattern employing multiple polynomial, multiple seed linear feedback shift register (MPMSLFSR). It has been shown that proper feedback connection and appropriate seed of LFSR produces better fault coverage using lower number of test pattern. We have also compared and validated the results with that of other researchers.
first_indexed 2025-11-15T08:15:57Z
format Conference or Workshop Item
id upm-18384
institution Universiti Putra Malaysia
institution_category Local University
language English
last_indexed 2025-11-15T08:15:57Z
publishDate 2002
publisher Universiti Putra Malaysia Press
recordtype eprints
repository_type Digital Repository
spelling upm-183842020-03-17T06:49:03Z http://psasir.upm.edu.my/id/eprint/18384/ Fault simulation using MPMSLFSR-based test pattern Ali, Md. Liakot Mohd Sidek, Roslina Mohd Ali, Mohd Alauddin Suparjoo, Bambang Sunaryo Wan Hasan, Wan Zuha This paper presents fault simulation results of ISCAS85 bench-mark circuits using test pattern employing multiple polynomial, multiple seed linear feedback shift register (MPMSLFSR). It has been shown that proper feedback connection and appropriate seed of LFSR produces better fault coverage using lower number of test pattern. We have also compared and validated the results with that of other researchers. Universiti Putra Malaysia Press 2002 Conference or Workshop Item PeerReviewed text en http://psasir.upm.edu.my/id/eprint/18384/1/18384.pdf Ali, Md. Liakot and Mohd Sidek, Roslina and Mohd Ali, Mohd Alauddin and Suparjoo, Bambang Sunaryo and Wan Hasan, Wan Zuha (2002) Fault simulation using MPMSLFSR-based test pattern. In: 2nd World Engineering Congress, 22-25 July 2002, Sarawak, Malaysia. (pp. 285-288).
spellingShingle Ali, Md. Liakot
Mohd Sidek, Roslina
Mohd Ali, Mohd Alauddin
Suparjoo, Bambang Sunaryo
Wan Hasan, Wan Zuha
Fault simulation using MPMSLFSR-based test pattern
title Fault simulation using MPMSLFSR-based test pattern
title_full Fault simulation using MPMSLFSR-based test pattern
title_fullStr Fault simulation using MPMSLFSR-based test pattern
title_full_unstemmed Fault simulation using MPMSLFSR-based test pattern
title_short Fault simulation using MPMSLFSR-based test pattern
title_sort fault simulation using mpmslfsr-based test pattern
url http://psasir.upm.edu.my/id/eprint/18384/
http://psasir.upm.edu.my/id/eprint/18384/1/18384.pdf