Design of a testchip for low cost IC testing.

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Design of a testchip for low cost IC testing.

With the continuous increase of the integration densities and complexities, the problem of testing integrated circuits has become much more acute and needs an economic solution with reliable performance. This paper presents the design of a TESTCHIP implementing a multiple polynomial, multiple seed b...

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Bibliographic Details
Main Authors:	Ali, Liakot, Sidek, Roslina, Aris, Ishak, Mohd Ali, Mohd Alauddin
Format:	Article
Language:	English English
Published:	Taylor & Francis 2009
Online Access:	http://psasir.upm.edu.my/id/eprint/17691/ http://psasir.upm.edu.my/id/eprint/17691/1/Design%20of%20a%20testchip%20for%20low%20cost%20IC%20testing.pdf

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