X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature.

X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature.

Semiconductor thin films copper tin selenide, Cu2SnSe3, a potential compound for solar cell applications or semiconductor radiation detector were prepared by thermal evaporation method onto well-cleaned glass substrates. The as-deposited films were annealed in flowing purified nitrogen, N2, for 2 h...

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Bibliographic Details
Main Authors: Talib, Zainal Abidin, Mat Yunus, Wan Mahmood, Mohd Yunos, Mohd Amirul Syafiq, Meor Sulaiman, Meor Yusoff, Paulus, Wilfred Sylvester
Format: Article
Language:English
English
Published: David Publishing Company 2010
Subjects:
X-rays - Diffraction.
Evaporation.
Heat - Transmission.
Online Access:http://psasir.upm.edu.my/id/eprint/17666/
http://psasir.upm.edu.my/id/eprint/17666/1/X-Ray%20diffraction%20analysis%20of%20thermally%20evaporated%20copper%20tin%20selenide%20thin%20films%20at%20different%20annealing%20temperature..pdf

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