Talib, Z. A., Mat Yunus, W. M., Mohd Yunos, M. A. S., Meor Sulaiman, M. Y., & Paulus, W. S. (2010). X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. David Publishing Company.
Chicago Style (17th ed.) CitationTalib, Zainal Abidin, Wan Mahmood Mat Yunus, Mohd Amirul Syafiq Mohd Yunos, Meor Yusoff Meor Sulaiman, and Wilfred Sylvester Paulus. X-Ray Diffraction Analysis of Thermally Evaporated Copper Tin Selenide Thin Films at Different Annealing Temperature. David Publishing Company, 2010.
MLA (9th ed.) CitationTalib, Zainal Abidin, et al. X-Ray Diffraction Analysis of Thermally Evaporated Copper Tin Selenide Thin Films at Different Annealing Temperature. David Publishing Company, 2010.
Warning: These citations may not always be 100% accurate.