Structural, morphology and electrical properties of layered copper selenide thin film
Thin films of copper selenide (CuSe) were physically deposited layer-by-layer up to 5 layers using thermal evaporation technique onto a glass substrate. Various film properties, including the thickness, structure, morphology, surface roughness, average grain size and electrical conductivity are stud...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Versita Warsaw and Springer
2009
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| Online Access: | http://psasir.upm.edu.my/id/eprint/16870/ http://psasir.upm.edu.my/id/eprint/16870/1/Structural%2C%20morphology%20and%20electrical%20properties%20of%20layered%20copper%20selenide%20thin%20film%20.pdf |
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| author | Ying, Josephine Chyi Liew Talib, Zainal Abidin Mat Yunus, Wan Mahmood Zainal, Zulkarnain Shaari, Abdul Halim Abd. Moksin, Mohd Maarof Wan Yusoff, Wan Mohd Daud Lim, Kean Pah |
| author_facet | Ying, Josephine Chyi Liew Talib, Zainal Abidin Mat Yunus, Wan Mahmood Zainal, Zulkarnain Shaari, Abdul Halim Abd. Moksin, Mohd Maarof Wan Yusoff, Wan Mohd Daud Lim, Kean Pah |
| author_sort | Ying, Josephine Chyi Liew |
| building | UPM Institutional Repository |
| collection | Online Access |
| description | Thin films of copper selenide (CuSe) were physically deposited layer-by-layer up to 5 layers using thermal evaporation technique onto a glass substrate. Various film properties, including the thickness, structure, morphology, surface roughness, average grain size and electrical conductivity are studied and discussed. These properties are characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), ellipsometer and 4 point probe at room temperature. The dependence of electrical conductivity, surface roughness, and average grain size on number of layers deposited is discussed. |
| first_indexed | 2025-11-15T08:09:22Z |
| format | Article |
| id | upm-16870 |
| institution | Universiti Putra Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-15T08:09:22Z |
| publishDate | 2009 |
| publisher | Versita Warsaw and Springer |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | upm-168702016-09-26T02:34:55Z http://psasir.upm.edu.my/id/eprint/16870/ Structural, morphology and electrical properties of layered copper selenide thin film Ying, Josephine Chyi Liew Talib, Zainal Abidin Mat Yunus, Wan Mahmood Zainal, Zulkarnain Shaari, Abdul Halim Abd. Moksin, Mohd Maarof Wan Yusoff, Wan Mohd Daud Lim, Kean Pah Thin films of copper selenide (CuSe) were physically deposited layer-by-layer up to 5 layers using thermal evaporation technique onto a glass substrate. Various film properties, including the thickness, structure, morphology, surface roughness, average grain size and electrical conductivity are studied and discussed. These properties are characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), ellipsometer and 4 point probe at room temperature. The dependence of electrical conductivity, surface roughness, and average grain size on number of layers deposited is discussed. Versita Warsaw and Springer 2009-06 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/16870/1/Structural%2C%20morphology%20and%20electrical%20properties%20of%20layered%20copper%20selenide%20thin%20film%20.pdf Ying, Josephine Chyi Liew and Talib, Zainal Abidin and Mat Yunus, Wan Mahmood and Zainal, Zulkarnain and Shaari, Abdul Halim and Abd. Moksin, Mohd Maarof and Wan Yusoff, Wan Mohd Daud and Lim, Kean Pah (2009) Structural, morphology and electrical properties of layered copper selenide thin film. Central European Journal of Physics, 7 (2). pp. 379-384. ISSN 1895-1082 http://www.degruyter.com/view/j/phys.2009.7.issue-2/s11534-009-0057-1/s11534-009-0057-1.xml 10.2478/s11534-009-0057-1 |
| spellingShingle | Ying, Josephine Chyi Liew Talib, Zainal Abidin Mat Yunus, Wan Mahmood Zainal, Zulkarnain Shaari, Abdul Halim Abd. Moksin, Mohd Maarof Wan Yusoff, Wan Mohd Daud Lim, Kean Pah Structural, morphology and electrical properties of layered copper selenide thin film |
| title | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_full | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_fullStr | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_full_unstemmed | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_short | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_sort | structural, morphology and electrical properties of layered copper selenide thin film |
| url | http://psasir.upm.edu.my/id/eprint/16870/ http://psasir.upm.edu.my/id/eprint/16870/ http://psasir.upm.edu.my/id/eprint/16870/ http://psasir.upm.edu.my/id/eprint/16870/1/Structural%2C%20morphology%20and%20electrical%20properties%20of%20layered%20copper%20selenide%20thin%20film%20.pdf |