Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature

This paper reports the structural and electrical conductivity characterization of the copper selenide (CuSe) metal chalcogenide semiconductor in bulk form. In situ X-ray powder diffraction analysis of CuSe at low temperature (100 – 300 K) is studied to support the electrical conductivity analysis....

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Main Authors: Talib, Zainal Abidin, Liew, Josephine Ying Chyi, Mat Yunus, Wan Mahmood, Zainal, Zulkarnain, Shaari, Abdul Halim, Abd. Moksin, Mohd Maarof, Lim, Kean Pah, Wan Yusoff, Wan Mohamad Daud
Format: Article
Language:English
Published: Malaysian Solid State Science and Technology Society 2008
Online Access:http://psasir.upm.edu.my/id/eprint/16865/
http://psasir.upm.edu.my/id/eprint/16865/1/Structural%20and%20electrical%20conductivity%20studies%20of%20polycrystalline%20copper%20selenide%20at%20low%20temperature.pdf
_version_ 1848843080881405952
author Talib, Zainal Abidin
Liew, Josephine Ying Chyi
Mat Yunus, Wan Mahmood
Zainal, Zulkarnain
Shaari, Abdul Halim
Abd. Moksin, Mohd Maarof
Lim, Kean Pah
Wan Yusoff, Wan Mohamad Daud
author_facet Talib, Zainal Abidin
Liew, Josephine Ying Chyi
Mat Yunus, Wan Mahmood
Zainal, Zulkarnain
Shaari, Abdul Halim
Abd. Moksin, Mohd Maarof
Lim, Kean Pah
Wan Yusoff, Wan Mohamad Daud
author_sort Talib, Zainal Abidin
building UPM Institutional Repository
collection Online Access
description This paper reports the structural and electrical conductivity characterization of the copper selenide (CuSe) metal chalcogenide semiconductor in bulk form. In situ X-ray powder diffraction analysis of CuSe at low temperature (100 – 300 K) is studied to support the electrical conductivity analysis. The electrical conductivity of the polycrystalline CuSe was measured and analyzed at low temperature (100 to 286 K)using 4 point probe technique. The electrical conductivity values obtained were in the range of 1.69 x 103 to 2.58 x 103 S/cm.
first_indexed 2025-11-15T08:09:21Z
format Article
id upm-16865
institution Universiti Putra Malaysia
institution_category Local University
language English
last_indexed 2025-11-15T08:09:21Z
publishDate 2008
publisher Malaysian Solid State Science and Technology Society
recordtype eprints
repository_type Digital Repository
spelling upm-168652016-09-26T01:48:43Z http://psasir.upm.edu.my/id/eprint/16865/ Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature Talib, Zainal Abidin Liew, Josephine Ying Chyi Mat Yunus, Wan Mahmood Zainal, Zulkarnain Shaari, Abdul Halim Abd. Moksin, Mohd Maarof Lim, Kean Pah Wan Yusoff, Wan Mohamad Daud This paper reports the structural and electrical conductivity characterization of the copper selenide (CuSe) metal chalcogenide semiconductor in bulk form. In situ X-ray powder diffraction analysis of CuSe at low temperature (100 – 300 K) is studied to support the electrical conductivity analysis. The electrical conductivity of the polycrystalline CuSe was measured and analyzed at low temperature (100 to 286 K)using 4 point probe technique. The electrical conductivity values obtained were in the range of 1.69 x 103 to 2.58 x 103 S/cm. Malaysian Solid State Science and Technology Society 2008 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/16865/1/Structural%20and%20electrical%20conductivity%20studies%20of%20polycrystalline%20copper%20selenide%20at%20low%20temperature.pdf Talib, Zainal Abidin and Liew, Josephine Ying Chyi and Mat Yunus, Wan Mahmood and Zainal, Zulkarnain and Shaari, Abdul Halim and Abd. Moksin, Mohd Maarof and Lim, Kean Pah and Wan Yusoff, Wan Mohamad Daud (2008) Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature. Solid State Science and Technology, 16 (1). pp. 147-152. ISSN 0128-7389 http://journal.masshp.net/volume-16-no-1-2008/
spellingShingle Talib, Zainal Abidin
Liew, Josephine Ying Chyi
Mat Yunus, Wan Mahmood
Zainal, Zulkarnain
Shaari, Abdul Halim
Abd. Moksin, Mohd Maarof
Lim, Kean Pah
Wan Yusoff, Wan Mohamad Daud
Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
title Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
title_full Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
title_fullStr Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
title_full_unstemmed Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
title_short Structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
title_sort structural and electrical conductivity studies of polycrystalline copper selenide at low temperature
url http://psasir.upm.edu.my/id/eprint/16865/
http://psasir.upm.edu.my/id/eprint/16865/
http://psasir.upm.edu.my/id/eprint/16865/1/Structural%20and%20electrical%20conductivity%20studies%20of%20polycrystalline%20copper%20selenide%20at%20low%20temperature.pdf