Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time...
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| Format: | Article |
| Language: | English English |
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Elsevier
2010
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| Online Access: | http://psasir.upm.edu.my/id/eprint/16286/ http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf |
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| author | Ebrahimiasl, Saeideh Wan Yunus, Wan Md. Zin Kassim, Anuar Zainal, Zulkarnain |
| author_facet | Ebrahimiasl, Saeideh Wan Yunus, Wan Md. Zin Kassim, Anuar Zainal, Zulkarnain |
| author_sort | Ebrahimiasl, Saeideh |
| building | UPM Institutional Repository |
| collection | Online Access |
| description | Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time of deposition and bath temperature. The effect of the mentioned process parameters on the grain size, thickness and absorbance of deposited layer during the deposition of nanocrystalline was investigated using X-ray diffraction (XRD) technique, atomic force microscopy (AFM) and UV–Visible spectroscopy. Comparison between the model predictions and the experimental observations predicted a remarkable agreement between them. The predictions of the model and sensitivity analysis showed that among the effective process parameters, deposition time and concentration were the main parameters having significant effect on crystalline size. Bath temperature had the most significant effect on absorbance and deposition time had a dominant effect on thickness. |
| first_indexed | 2025-11-15T08:06:46Z |
| format | Article |
| id | upm-16286 |
| institution | Universiti Putra Malaysia |
| institution_category | Local University |
| language | English English |
| last_indexed | 2025-11-15T08:06:46Z |
| publishDate | 2010 |
| publisher | Elsevier |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | upm-162862015-09-10T07:16:02Z http://psasir.upm.edu.my/id/eprint/16286/ Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design Ebrahimiasl, Saeideh Wan Yunus, Wan Md. Zin Kassim, Anuar Zainal, Zulkarnain Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time of deposition and bath temperature. The effect of the mentioned process parameters on the grain size, thickness and absorbance of deposited layer during the deposition of nanocrystalline was investigated using X-ray diffraction (XRD) technique, atomic force microscopy (AFM) and UV–Visible spectroscopy. Comparison between the model predictions and the experimental observations predicted a remarkable agreement between them. The predictions of the model and sensitivity analysis showed that among the effective process parameters, deposition time and concentration were the main parameters having significant effect on crystalline size. Bath temperature had the most significant effect on absorbance and deposition time had a dominant effect on thickness. Elsevier 2010 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf Ebrahimiasl, Saeideh and Wan Yunus, Wan Md. Zin and Kassim, Anuar and Zainal, Zulkarnain (2010) Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design. Solid State Sciences, 12 (8). pp. 1323-1327. ISSN 1293-2558 Nanocrystals Thin films 10.1016/j.solidstatesciences.2010.04.033 English |
| spellingShingle | Nanocrystals Thin films Ebrahimiasl, Saeideh Wan Yunus, Wan Md. Zin Kassim, Anuar Zainal, Zulkarnain Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design |
| title | Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design |
| title_full | Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design |
| title_fullStr | Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design |
| title_full_unstemmed | Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design |
| title_short | Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design |
| title_sort | prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by taguchi robust design |
| topic | Nanocrystals Thin films |
| url | http://psasir.upm.edu.my/id/eprint/16286/ http://psasir.upm.edu.my/id/eprint/16286/ http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf |