Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency

Dynamic Thermal Management (DTM) emerged as a solution to address the reliability challenges with thermal hotspots and unbalanced temperatures. DTM efficiency is highly affected by the accuracy of the temperature information presented to the DTM manager. This work aims to investigate the effect of i...

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Main Authors: Rahimipour, Somayeh, Flayyih, Wameedh Nazar, Kamsani, Noor Ain, Stan, Mircea, Rokhani, Fakhrul Zaman
Format: Conference or Workshop Item
Language:English
Published: IEEE 2015
Online Access:http://psasir.upm.edu.my/id/eprint/14333/
http://psasir.upm.edu.my/id/eprint/14333/1/Investigating%20the%20impact%20of%20on-chip%20interconnection%20noise%20on%20dynamic%20thermal%20management%20efficiency.pdf
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author Rahimipour, Somayeh
Flayyih, Wameedh Nazar
Kamsani, Noor Ain
Stan, Mircea
Rokhani, Fakhrul Zaman
author_facet Rahimipour, Somayeh
Flayyih, Wameedh Nazar
Kamsani, Noor Ain
Stan, Mircea
Rokhani, Fakhrul Zaman
author_sort Rahimipour, Somayeh
building UPM Institutional Repository
collection Online Access
description Dynamic Thermal Management (DTM) emerged as a solution to address the reliability challenges with thermal hotspots and unbalanced temperatures. DTM efficiency is highly affected by the accuracy of the temperature information presented to the DTM manager. This work aims to investigate the effect of inaccuracy caused by the deep sub-micron (DSM) noise during the transmission of temperature information to the manager on DTM efficiency. A simulation framework has been developed and results show up to 38% DTM performance degradation and 18% unattended cycles in emergency temperature under DSM noise. The finding highlights the importance of further research in providing reliable on-chip data transmission in DTM application.
first_indexed 2025-11-15T07:57:57Z
format Conference or Workshop Item
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institution Universiti Putra Malaysia
institution_category Local University
language English
last_indexed 2025-11-15T07:57:57Z
publishDate 2015
publisher IEEE
recordtype eprints
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spelling upm-143332019-04-08T08:31:28Z http://psasir.upm.edu.my/id/eprint/14333/ Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency Rahimipour, Somayeh Flayyih, Wameedh Nazar Kamsani, Noor Ain Stan, Mircea Rokhani, Fakhrul Zaman Dynamic Thermal Management (DTM) emerged as a solution to address the reliability challenges with thermal hotspots and unbalanced temperatures. DTM efficiency is highly affected by the accuracy of the temperature information presented to the DTM manager. This work aims to investigate the effect of inaccuracy caused by the deep sub-micron (DSM) noise during the transmission of temperature information to the manager on DTM efficiency. A simulation framework has been developed and results show up to 38% DTM performance degradation and 18% unattended cycles in emergency temperature under DSM noise. The finding highlights the importance of further research in providing reliable on-chip data transmission in DTM application. IEEE 2015 Conference or Workshop Item PeerReviewed text en http://psasir.upm.edu.my/id/eprint/14333/1/Investigating%20the%20impact%20of%20on-chip%20interconnection%20noise%20on%20dynamic%20thermal%20management%20efficiency.pdf Rahimipour, Somayeh and Flayyih, Wameedh Nazar and Kamsani, Noor Ain and Stan, Mircea and Rokhani, Fakhrul Zaman (2015) Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency. In: 2015 IEEE International Circuits and Systems Symposium (ICSyS 2015), 2-4 Sept. 2015, Holiday Villa Beach Resort & Spa, Langkawi, Kedah. (pp. 85-89). 10.1109/CircuitsAndSystems.2015.7394070
spellingShingle Rahimipour, Somayeh
Flayyih, Wameedh Nazar
Kamsani, Noor Ain
Stan, Mircea
Rokhani, Fakhrul Zaman
Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
title Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
title_full Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
title_fullStr Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
title_full_unstemmed Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
title_short Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
title_sort investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
url http://psasir.upm.edu.my/id/eprint/14333/
http://psasir.upm.edu.my/id/eprint/14333/
http://psasir.upm.edu.my/id/eprint/14333/1/Investigating%20the%20impact%20of%20on-chip%20interconnection%20noise%20on%20dynamic%20thermal%20management%20efficiency.pdf