An efficient fault syndromes simulator for SRAM memories

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An efficient fault syndromes simulator for SRAM memories

Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, March test algorith...

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Bibliographic Details
Main Authors:	Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Othman, Masuri
Format:	Article
Language:	English
Published:	The Institute of Electronics, Information and Communication Engineers 2009
Online Access:	http://psasir.upm.edu.my/id/eprint/13025/ http://psasir.upm.edu.my/id/eprint/13025/1/An%20efficient%20fault%20syndromes%20simulator%20for%20SRAM%20memories.pdf

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