A fault syndromes simulator for random access memories

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A fault syndromes simulator for random access memories

Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algo...

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Bibliographic Details
Main Authors:	Wan Hasan, Wan Zuha, Abdul Halim, Izhal, Mohd Sidek, Roslina, Othman, Masuri
Format:	Article
Language:	English English
Published:	EuroJournals 2008
Online Access:	http://psasir.upm.edu.my/id/eprint/12689/ http://psasir.upm.edu.my/id/eprint/12689/1/A%20fault%20syndromes%20simulator%20for%20random%20access%20memories.pdf

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