Double adjacent error correction codes for ultra-fast cache memories

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Double adjacent error correction codes for ultra-fast cache memories

Error correction codes are commonly used to protect cache memories from soft errors. As technology feature size scales deeper into sub-nanometer regime, radiation-induced soft error can causes double adjacent error (DAE). Several double adjacent error correction (DAEC) codes have been introduced to...

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Bibliographic Details
Main Authors:	Abood Ahmed, Rabah, Samsudin, Khairulmizam
Format:	Article
Language:	English
Published:	Institute of Electrical and Electronics Engineers 2025
Online Access:	http://psasir.upm.edu.my/id/eprint/115433/ http://psasir.upm.edu.my/id/eprint/115433/1/115433.pdf

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