Development of Test Procedure For CMOS Operational Amplifier Application Circuits

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Development of Test Procedure For CMOS Operational Amplifier Application Circuits

The integrated circuit (IC) is an ultra-small and fragile electrical system. A chip is basically an IC placed in a protective black plastic casing. The only contact the outside world has with the IC is through the chips input-output and power supply pins. ICs are also prone to damage and to locat...

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Bibliographic Details
Main Author:	Abdul Halin, Izhal
Format:	Thesis
Language:	English English
Published:	2002
Subjects:	Amplifiers (Electronics) Circuits training
Online Access:	http://psasir.upm.edu.my/id/eprint/10476/ http://psasir.upm.edu.my/id/eprint/10476/1/FK_2002_8.pdf

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