Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method

Samarium orthoferrite, SmFeO3 (SFO), is a multifunctional material with promised applications. In this paper, SFO thin films were prepared by sol–gel method onto a quartz substrate at different annealing temperatures (T = 700, 750, 800 and 850 °C) and onto LaNiO3 (LNO) buffered quartz substrate usin...

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Main Authors: Baqiah, Hussein, Awang Kechik, Mohd Mustafa, Mohammed Al-Hada, Naif, Liu, Jian, Xu, Shicai, Zhang, Na, Li, Qiang, Wang, Zhenxing, Al-Gaashani, Rashad, Wang, Jihua
Format: Article
Published: Elsevier 2022
Online Access:http://psasir.upm.edu.my/id/eprint/102175/
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author Baqiah, Hussein
Awang Kechik, Mohd Mustafa
Mohammed Al-Hada, Naif
Liu, Jian
Xu, Shicai
Zhang, Na
Li, Qiang
Wang, Zhenxing
Al-Gaashani, Rashad
Wang, Jihua
author_facet Baqiah, Hussein
Awang Kechik, Mohd Mustafa
Mohammed Al-Hada, Naif
Liu, Jian
Xu, Shicai
Zhang, Na
Li, Qiang
Wang, Zhenxing
Al-Gaashani, Rashad
Wang, Jihua
author_sort Baqiah, Hussein
building UPM Institutional Repository
collection Online Access
description Samarium orthoferrite, SmFeO3 (SFO), is a multifunctional material with promised applications. In this paper, SFO thin films were prepared by sol–gel method onto a quartz substrate at different annealing temperatures (T = 700, 750, 800 and 850 °C) and onto LaNiO3 (LNO) buffered quartz substrate using T = 800 °C. The phase formation, microstructure, electronic, optical, magnetic and ferroelectric properties of the films were investigated and compared. Minimal annealing temperature (T) from thermogravimetric analysis was about 720 °C. From X-ray diffraction analysis, film T = 700 °C showed mixed phases of SFO and a trace amount of Sm2O3 while single phase of SFO was observed for films T = 750 – 850 °C. The lattice parameter c and microstrain reduced for films T = 700 – 800 °C and then increased for film T = 850 °C. From Atomic force microscopy analysis, the porosity, root mean square roughness and particle size of the films increased with the rise of T. All films exhibited high optical transmittance (∼79 – 95 %) in 800 – 550 nm wavelength range and showed two main optical absorptions peaks at about 285 and 385 nm. At lower energy transition, the band gap (Eg) reduced from ∼ 2.79 to 2.72 eV for films T = 700 – 800 °C and then increased to ∼ 2.79 eV for film T = 850 °C. The film’s magnetisation (Ms) tended to increase with T increment. The SFO/LNO film showed higher Ms and Eg than film T = 800 °C.
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spelling upm-1021752023-07-12T01:03:07Z http://psasir.upm.edu.my/id/eprint/102175/ Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method Baqiah, Hussein Awang Kechik, Mohd Mustafa Mohammed Al-Hada, Naif Liu, Jian Xu, Shicai Zhang, Na Li, Qiang Wang, Zhenxing Al-Gaashani, Rashad Wang, Jihua Samarium orthoferrite, SmFeO3 (SFO), is a multifunctional material with promised applications. In this paper, SFO thin films were prepared by sol–gel method onto a quartz substrate at different annealing temperatures (T = 700, 750, 800 and 850 °C) and onto LaNiO3 (LNO) buffered quartz substrate using T = 800 °C. The phase formation, microstructure, electronic, optical, magnetic and ferroelectric properties of the films were investigated and compared. Minimal annealing temperature (T) from thermogravimetric analysis was about 720 °C. From X-ray diffraction analysis, film T = 700 °C showed mixed phases of SFO and a trace amount of Sm2O3 while single phase of SFO was observed for films T = 750 – 850 °C. The lattice parameter c and microstrain reduced for films T = 700 – 800 °C and then increased for film T = 850 °C. From Atomic force microscopy analysis, the porosity, root mean square roughness and particle size of the films increased with the rise of T. All films exhibited high optical transmittance (∼79 – 95 %) in 800 – 550 nm wavelength range and showed two main optical absorptions peaks at about 285 and 385 nm. At lower energy transition, the band gap (Eg) reduced from ∼ 2.79 to 2.72 eV for films T = 700 – 800 °C and then increased to ∼ 2.79 eV for film T = 850 °C. The film’s magnetisation (Ms) tended to increase with T increment. The SFO/LNO film showed higher Ms and Eg than film T = 800 °C. Elsevier 2022 Article PeerReviewed Baqiah, Hussein and Awang Kechik, Mohd Mustafa and Mohammed Al-Hada, Naif and Liu, Jian and Xu, Shicai and Zhang, Na and Li, Qiang and Wang, Zhenxing and Al-Gaashani, Rashad and Wang, Jihua (2022) Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method. Results in Physics, 36. art. no. 105446. pp. 1-10. ISSN 2211-3797 https://www.sciencedirect.com/science/article/pii/S2211379722002005 10.1016/j.rinp.2022.105446
spellingShingle Baqiah, Hussein
Awang Kechik, Mohd Mustafa
Mohammed Al-Hada, Naif
Liu, Jian
Xu, Shicai
Zhang, Na
Li, Qiang
Wang, Zhenxing
Al-Gaashani, Rashad
Wang, Jihua
Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method
title Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method
title_full Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method
title_fullStr Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method
title_full_unstemmed Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method
title_short Microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method
title_sort microstructural and physical properties of samarium orthoferrite thin films by the sol-gel method
url http://psasir.upm.edu.my/id/eprint/102175/
http://psasir.upm.edu.my/id/eprint/102175/
http://psasir.upm.edu.my/id/eprint/102175/