APA (7th ed.) Citation

Sevamalai, V. K. (1998). Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection.

Chicago Style (17th ed.) Citation

Sevamalai, Venantius Kumar. Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection. 1998.

MLA (9th ed.) Citation

Sevamalai, Venantius Kumar. Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection. 1998.

Warning: These citations may not always be 100% accurate.