APA (7th ed.) Citation

Abdul Manaf, A. H. (1998). Failure Analysis Investigation on 2N7002LTI TMOS Device Due to Electrostatic Discharge (ESD) Failures.

Chicago Style (17th ed.) Citation

Abdul Manaf, Abdul Halim. Failure Analysis Investigation on 2N7002LTI TMOS Device Due to Electrostatic Discharge (ESD) Failures. 1998.

MLA (9th ed.) Citation

Abdul Manaf, Abdul Halim. Failure Analysis Investigation on 2N7002LTI TMOS Device Due to Electrostatic Discharge (ESD) Failures. 1998.

Warning: These citations may not always be 100% accurate.