Husin, M., Leong, S., & Sabri, M. (2013). Built in self test for RAM using VHDL. IEEE.
Chicago Style (17th ed.) CitationHusin, M.H, S.Y Leong, and M.F.M Sabri. Built in Self Test for RAM Using VHDL. IEEE, 2013.
MLA (9th ed.) CitationHusin, M.H, et al. Built in Self Test for RAM Using VHDL. IEEE, 2013.
Warning: These citations may not always be 100% accurate.