The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

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The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical cha...

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Bibliographic Details
Main Author:	Norhuzaimin, Julai
Format:	Article
Language:	English
Published:	JASPE 2015
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://ir.unimas.my/id/eprint/13739/ http://ir.unimas.my/id/eprint/13739/1/Norhuzaimin.pdf

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