Improving on board integrated circuits testing using one shared test access port and single bidirectional test data line

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Improving on board integrated circuits testing using one shared test access port and single bidirectional test data line

Traditional test and measurement equipment that relies on connecting external probes is no longer possible given the state of the art of today’s shrinking printed circuit boards (PCBs). Since probing is extremely difficult, other methods must then be explored. A new and reliable approach for test...

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Bibliographic Details
Main Author:	Salim Ahmad, Jayousi
Format:	Thesis
Language:	English
Published:	Universiti Malaysia Sarawak, (UNIMAS) 2015
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://ir.unimas.my/id/eprint/10800/ http://ir.unimas.my/id/eprint/10800/1/Salim.pdf

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