APA (7th ed.) Citation

Salim Ahmad, J. (2015). Improving on board integrated circuits testing using one shared test access port and single bidirectional test data line. Universiti Malaysia Sarawak, (UNIMAS).

Chicago Style (17th ed.) Citation

Salim Ahmad, Jayousi. Improving on Board Integrated Circuits Testing Using One Shared Test Access Port and Single Bidirectional Test Data Line. Universiti Malaysia Sarawak, (UNIMAS), 2015.

MLA (9th ed.) Citation

Salim Ahmad, Jayousi. Improving on Board Integrated Circuits Testing Using One Shared Test Access Port and Single Bidirectional Test Data Line. Universiti Malaysia Sarawak, (UNIMAS), 2015.