Test Data Generation for Event Driven System Using Bees Algorithm

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Test Data Generation for Event Driven System Using Bees Algorithm

For an event driven system, the order of the event sequence should also be tested to detect failure in any possible sequences of the event. In many real time or reactive system, some faults do occur as a result interactions of some particular order of the inputs or events. In some other systems,...

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Bibliographic Details
Main Authors:	Mohammed Zabil, Mohd H., Kamal Z., Zamli
Format:	Conference or Workshop Item
Language:	English
Published:	2013
Subjects:	QA75 Electronic computers. Computer science
Online Access:	http://umpir.ump.edu.my/id/eprint/6942/ http://umpir.ump.edu.my/id/eprint/6942/1/Paper_1.pdf

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