An efficient approach for vision inspection of IC chips

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An efficient approach for vision inspection of IC chips

The research aims to develop an automated vision inspection system of IC chips that used to detect the defects of marking and design shape of IC chips.As a result of higher failure probability of manual inspection system, this automated system is developed.The automated vision system will consists o...

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Bibliographic Details
Main Author:	Kok Wah, Liew
Format:	Undergraduates Project Papers
Language:	English
Published:	2012
Subjects:	TA Engineering (General). Civil engineering (General)
Online Access:	http://umpir.ump.edu.my/id/eprint/4418/ http://umpir.ump.edu.my/id/eprint/4418/1/03.An%20efficient%20approach%20for%20vision%20inspection%20of%20IC%20chips.pdf

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