APA (7th ed.) Citation

Batool, U., Mohd Ibrahim, S., Mostafa, S. A., & Mohd Zamri, I. (2023). An attention-augmented convolutional neural network with focal loss for mixed-type wafer defect classification. Institute of Electrical and Electronics Engineers Inc.

Chicago Style (17th ed.) Citation

Batool, Uzma, Shapiai Mohd Ibrahim, Salama A. Mostafa, and Ibrahim Mohd Zamri. An Attention-augmented Convolutional Neural Network with Focal Loss for Mixed-type Wafer Defect Classification. Institute of Electrical and Electronics Engineers Inc, 2023.

MLA (9th ed.) Citation

Batool, Uzma, et al. An Attention-augmented Convolutional Neural Network with Focal Loss for Mixed-type Wafer Defect Classification. Institute of Electrical and Electronics Engineers Inc, 2023.