APA (7th ed.) Citation

Ismail, M. K., Lim, S. X., Mohd Azraai, M. R., Jessnor Arif, M. J., Yuen, E., Jiang, H., . . . Anwar, P. P. A. M. (2023). The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. Springer Nature.

Chicago Style (17th ed.) Citation

Ismail, Mohd Khairuddin, Shi Xuen Lim, Mohd Razman Mohd Azraai, Mat Jizat Jessnor Arif, Edmund Yuen, Haochuan Jiang, Eng Hwa Yap, and P. P. Abdul Majeed Anwar. The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. Springer Nature, 2023.

MLA (9th ed.) Citation

Ismail, Mohd Khairuddin, et al. The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. Springer Nature, 2023.