Evaluation of the Transfer Learning Models in Wafer Defects Classification

Evaluation of the Transfer Learning Models in Wafer Defects Classification

In a semiconductor industry, wafer defect detection has becoming ubiquitous. Various machine learning algorithms had been adopted to be the “brain” behind the machine for reliable, fast defect detection. Transfer Learning is one of the common methods. Various algorithms under Transfer Learning had b...

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Bibliographic Details
Main Authors: Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen
Format: Conference or Workshop Item
Language:English
Published: Springer Nature 2022
Subjects:
TJ Mechanical engineering and machinery
Online Access:http://umpir.ump.edu.my/id/eprint/36763/
http://umpir.ump.edu.my/id/eprint/36763/1/Evaluation%20of%20the%20Transfer%20Learning%20Models%20in%20Wafer%20Defects%20Classification%20%281%29.pdf

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