Jessnor Arif, M. J., Ahmad Fakhri, A. N., Anwar P. P., A. M., & Yuen, E. (2020). Effect of image compression using fast fourier transformation and discrete wavelet transformation on transfer learning wafer defect image classification. Penerbit UMP.
Chicago Style (17th ed.) CitationJessnor Arif, Mat Jizat, Ab. Nasir Ahmad Fakhri, Abdul Majeed Anwar P. P., and Edmund Yuen. Effect of Image Compression Using Fast Fourier Transformation and Discrete Wavelet Transformation on Transfer Learning Wafer Defect Image Classification. Penerbit UMP, 2020.
MLA (9th ed.) CitationJessnor Arif, Mat Jizat, et al. Effect of Image Compression Using Fast Fourier Transformation and Discrete Wavelet Transformation on Transfer Learning Wafer Defect Image Classification. Penerbit UMP, 2020.