The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO

Zinc oxide (ZnO) is a wide band gap material (~3.37 eV) which has small exciton Bohr radius ~2.34 nm. In dye-sensitized solar cell, ZnO thin film is used as photoelectrode. Light-sensitive organic/ inorganic fluorophores could be adsorbed on the surface of the ZnO film, which later will be sandwiche...

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Main Authors: Azmi, Fatin Farisha Alia, Muzakir, Saifful K., Kadir, Mohd Fakhrul Zamani, Aziz, Shujahadeen B.
Format: Article
Language:English
Published: Universiti Putra Malaysia 2021
Subjects:
Online Access:http://umpir.ump.edu.my/id/eprint/32688/
http://umpir.ump.edu.my/id/eprint/32688/1/The%20effect%20of%20number%20of%20vacuum%20thermal%20evaporation.pdf
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author Azmi, Fatin Farisha Alia
Muzakir, Saifful K.
Kadir, Mohd Fakhrul Zamani
Aziz, Shujahadeen B.
author_facet Azmi, Fatin Farisha Alia
Muzakir, Saifful K.
Kadir, Mohd Fakhrul Zamani
Aziz, Shujahadeen B.
author_sort Azmi, Fatin Farisha Alia
building UMP Institutional Repository
collection Online Access
description Zinc oxide (ZnO) is a wide band gap material (~3.37 eV) which has small exciton Bohr radius ~2.34 nm. In dye-sensitized solar cell, ZnO thin film is used as photoelectrode. Light-sensitive organic/ inorganic fluorophores could be adsorbed on the surface of the ZnO film, which later will be sandwiched with electrolyte and a counter electrode. The aim of this paper is to study the effect of number of evaporation cycle to the yielded morphology and size of ZnO building blocks; deposited using one, two, and three cycles of vacuum thermal evaporation technique. The ZnO thin films have been deposited on ITO glass substrate at vacuum pressure of 5 ´ 10-5 Torr, 116 A, and 2.6 V. The morphology of the thin films has been examined under Field Emission Scanning Electron Microscope (FESEM), which showed nanosphere morphology. The morphological observation is supported by a simulation; which calculated based on the crystallographic properties of the synthesized ZnO – characterized by X-ray diffractometer (XRD). Three sets of the ZnO thin films consists of ZnO particles in the range of 8 – 20 nm, 11 – 37 nm, and 6 – 16 nm respectively. According to the optical properties characterized by absorption spectrometer, it has been observed that the band gap of the thin films increased with increasing number of evaporation cycles. The values of the optical bandgap, Eg evaluated from Tauc’s plot, were found in the range between 2.40 eV to 2.60 eV.
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spelling ump-326882021-12-29T02:15:28Z http://umpir.ump.edu.my/id/eprint/32688/ The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO Azmi, Fatin Farisha Alia Muzakir, Saifful K. Kadir, Mohd Fakhrul Zamani Aziz, Shujahadeen B. TP Chemical technology Zinc oxide (ZnO) is a wide band gap material (~3.37 eV) which has small exciton Bohr radius ~2.34 nm. In dye-sensitized solar cell, ZnO thin film is used as photoelectrode. Light-sensitive organic/ inorganic fluorophores could be adsorbed on the surface of the ZnO film, which later will be sandwiched with electrolyte and a counter electrode. The aim of this paper is to study the effect of number of evaporation cycle to the yielded morphology and size of ZnO building blocks; deposited using one, two, and three cycles of vacuum thermal evaporation technique. The ZnO thin films have been deposited on ITO glass substrate at vacuum pressure of 5 ´ 10-5 Torr, 116 A, and 2.6 V. The morphology of the thin films has been examined under Field Emission Scanning Electron Microscope (FESEM), which showed nanosphere morphology. The morphological observation is supported by a simulation; which calculated based on the crystallographic properties of the synthesized ZnO – characterized by X-ray diffractometer (XRD). Three sets of the ZnO thin films consists of ZnO particles in the range of 8 – 20 nm, 11 – 37 nm, and 6 – 16 nm respectively. According to the optical properties characterized by absorption spectrometer, it has been observed that the band gap of the thin films increased with increasing number of evaporation cycles. The values of the optical bandgap, Eg evaluated from Tauc’s plot, were found in the range between 2.40 eV to 2.60 eV. Universiti Putra Malaysia 2021-04-01 Article PeerReviewed pdf en http://umpir.ump.edu.my/id/eprint/32688/1/The%20effect%20of%20number%20of%20vacuum%20thermal%20evaporation.pdf Azmi, Fatin Farisha Alia and Muzakir, Saifful K. and Kadir, Mohd Fakhrul Zamani and Aziz, Shujahadeen B. (2021) The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO. Malaysian Journal of Microscopy, 17 (1). 56 -68. ISSN 1823-7010. (Published) https://malaysianjournalofmicroscopy.org/ojs/index.php/mjm/article/view/506
spellingShingle TP Chemical technology
Azmi, Fatin Farisha Alia
Muzakir, Saifful K.
Kadir, Mohd Fakhrul Zamani
Aziz, Shujahadeen B.
The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO
title The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO
title_full The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO
title_fullStr The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO
title_full_unstemmed The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO
title_short The effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of ZnO
title_sort effect of number of vacuum thermal evaporation cycles to the optoelectronic and morphological properties of zno
topic TP Chemical technology
url http://umpir.ump.edu.my/id/eprint/32688/
http://umpir.ump.edu.my/id/eprint/32688/
http://umpir.ump.edu.my/id/eprint/32688/1/The%20effect%20of%20number%20of%20vacuum%20thermal%20evaporation.pdf