Jessnor Arif, M. J., Anwar, P. P. A. M., Ahmad Fakhri, A. N., Zahari, T., & Yuen, E. (2021). Evaluation of the machine learning classifier in wafer defects classification. Elsevier.
Chicago Style (17th ed.) CitationJessnor Arif, Mat Jizat, P. P. Abdul Majeed Anwar, Ab. Nasir Ahmad Fakhri, Taha Zahari, and Edmund Yuen. Evaluation of the Machine Learning Classifier in Wafer Defects Classification. Elsevier, 2021.
MLA (9th ed.) CitationJessnor Arif, Mat Jizat, et al. Evaluation of the Machine Learning Classifier in Wafer Defects Classification. Elsevier, 2021.
Warning: These citations may not always be 100% accurate.