Characterization of sub-millimeter backside-slit defects on galvanized steel plates using a phase-sensitive AMR gradiometer and low excitation frequency

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Characterization of sub-millimeter backside-slit defects on galvanized steel plates using a phase-sensitive AMR gradiometer and low excitation frequency

Backside inspection of metallic materials such as the widely used galvanized steels, is a challenging inspection in Non-Destructive Tests (NDTs) using eddy current (EC) and magnetic flux leakage (MFL) techniques. This is due to the propagation characteristic of electromagnetic waves is governed by t...

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Bibliographic Details
Main Authors:	Mohd Mawardi, Saari, Mohd Aufa Hadi Putera, Zaini, Nurul Ain, Nadzri, Mohd Herwan, Sulaiman, Aiman, Mohd Halil, Kenji, Sakai, Toshihiko, Kiwa, Keiji, Tsukada
Format:	Conference or Workshop Item
Language:	English English
Published:	Universiti Malaysia Pahang 2020
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://umpir.ump.edu.my/id/eprint/28846/ http://umpir.ump.edu.my/id/eprint/28846/1/31.%20Characterization%20of%20sub-millimeter%20backside-slit%20defects.pdf http://umpir.ump.edu.my/id/eprint/28846/2/31.1%20Characterization%20of%20sub-millimeter%20backside-slit%20defects.pdf

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