Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric / Nissar Mohammad Karim

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Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric / Nissar Mohammad Karim

Negative Bias Temperature Instability (NBTI) and oxide delay are considered as threats to Complementary Metal Oxide Semiconductor (CMOS) transistors. Improving these issues result in improved performance in terms of reliability. In this thesis, to ensure reliability in transistors, the results on th...

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Bibliographic Details
Main Author:	Nissar, Mohammad Karim
Format:	Thesis
Published:	2015
Subjects:	T Technology (General) TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://studentsrepo.um.edu.my/7563/ http://studentsrepo.um.edu.my/7563/4/Final_Submission_Nissar_KHA110002.pdf

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