Microstructural characterization of Au-In Thin film deposited by electron beam evaporation
The microstructure and phase formation of Au-In thin film deposited by e-beam evaporation technique has been studied. Single crystals of rocksalt were used as the substrates. The chamber pressure during deposition was about 2.5 10-5 torr and substrate temperature was 35ºC. Three types of samples...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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Universiti Kebangsaan Malaysia
2009
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| Online Access: | http://journalarticle.ukm.my/62/ http://journalarticle.ukm.my/62/1/ |
| _version_ | 1848809132083118080 |
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| author | Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar, |
| author_facet | Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar, |
| author_sort | Norliza Ismail, |
| building | UKM Institutional Repository |
| collection | Online Access |
| description | The microstructure and phase formation of Au-In thin film deposited by e-beam evaporation technique has been studied.
Single crystals of rocksalt were used as the substrates. The chamber pressure during deposition was about 2.5 10-5 torr
and substrate temperature was 35ºC. Three types of samples were prepared namely Au, In and Au-In thin films.
Microstructure and chemical composition of these thin films were characterized by transmission electron microscopy
(TEM) and X-ray photoelectron spectrometer (XPS) respectively. TEM micrograph reveals island structures for both Au and
In thin film on the rocksalt substrate, with the In island size distribution is about 9-30 nm compared to Au island in the
range of 3-10 nm. The growth of islands instead of smooth film indicates that Au and In thin films follow the Volmer-
Weber growth mode. However, island structures were not present on Au-In thin films which most probably follow the
Frank van de Merwe growth mode. XPS analysis indicates intermetallic compound was not present in the Au-In thin film
suggesting that diffusion process in the interface of Au and In films is minimal. |
| first_indexed | 2025-11-14T23:09:45Z |
| format | Article |
| id | ukm-62 |
| institution | Universiti Kebangasaan Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T23:09:45Z |
| publishDate | 2009 |
| publisher | Universiti Kebangsaan Malaysia |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | ukm-622016-12-14T06:26:17Z http://journalarticle.ukm.my/62/ Microstructural characterization of Au-In Thin film deposited by electron beam evaporation Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar, The microstructure and phase formation of Au-In thin film deposited by e-beam evaporation technique has been studied. Single crystals of rocksalt were used as the substrates. The chamber pressure during deposition was about 2.5 10-5 torr and substrate temperature was 35ºC. Three types of samples were prepared namely Au, In and Au-In thin films. Microstructure and chemical composition of these thin films were characterized by transmission electron microscopy (TEM) and X-ray photoelectron spectrometer (XPS) respectively. TEM micrograph reveals island structures for both Au and In thin film on the rocksalt substrate, with the In island size distribution is about 9-30 nm compared to Au island in the range of 3-10 nm. The growth of islands instead of smooth film indicates that Au and In thin films follow the Volmer- Weber growth mode. However, island structures were not present on Au-In thin films which most probably follow the Frank van de Merwe growth mode. XPS analysis indicates intermetallic compound was not present in the Au-In thin film suggesting that diffusion process in the interface of Au and In films is minimal. Universiti Kebangsaan Malaysia 2009-02 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/62/1/ Norliza Ismail, and Muhammad Azmi Abdul Hamid, and Azman Jalar, (2009) Microstructural characterization of Au-In Thin film deposited by electron beam evaporation. Sains Malaysiana, 38 (1). pp. 91-94. ISSN 0126-6039 http://www.ukm.my/~jsm/utama.html |
| spellingShingle | Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar, Microstructural characterization of Au-In Thin film deposited by electron beam evaporation |
| title | Microstructural characterization of Au-In Thin film deposited by electron beam evaporation |
| title_full | Microstructural characterization of Au-In Thin film deposited by electron beam evaporation |
| title_fullStr | Microstructural characterization of Au-In Thin film deposited by electron beam evaporation |
| title_full_unstemmed | Microstructural characterization of Au-In Thin film deposited by electron beam evaporation |
| title_short | Microstructural characterization of Au-In Thin film deposited by electron beam evaporation |
| title_sort | microstructural characterization of au-in thin film deposited by electron beam evaporation |
| url | http://journalarticle.ukm.my/62/ http://journalarticle.ukm.my/62/ http://journalarticle.ukm.my/62/1/ |