Investigation of latch-up behaviour in 0.5 micron CMOS technology / Wan Fazlida Hanim Abdullah, Suhana Sulaiman and Mohd Jamil Napiah

Investigation of latch-up behaviour in 0.5 micron CMOS technology / Wan Fazlida Hanim Abdullah, Suhana Sulaiman and Mohd Jamil Napiah

The research project investigates available latch-up test structures from MIMOS Berhad and covers current-voltage characterization of silicon-controlled rectifier behaviour of parasitic BJTs in CMOS technology. Measurement setup utilizing the structures for IV measurements are designed. A suitable m...

Full description

Bibliographic Details
Main Authors: Abdullah, Wan Fazlida Hanim, Sulaiman, Suhana Sulaiman, Napiah, Mohd Jamil
Format: Monograph
Language:English
Published: Institute of Research, Development and Commercialization , Universiti Teknologi MARA 2005
Subjects:
Electronics
Online Access:https://ir.uitm.edu.my/id/eprint/8030/

Similar Items

Similar Items