Bayesian estimation of time to failure distributions based on skew normal degradation model : an application to GaAs laser degradation data

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Bayesian estimation of time to failure distributions based on skew normal degradation model : an application to GaAs laser degradation data

In this paper, the Bayesian method which involves informative and weakly informative priors are considered to estimate the parameters and percentiles of the time to failure distribution. The parameters of the time to failure distribution and its percentiles are determined based on linear degradation...

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Bibliographic Details
Main Authors:	Laila Naji Ba Dakhn, Mohd Aftar Abu Bakar, Kamarulzaman Ibrahim
Format:	Article
Language:	English
Published:	Penerbit Universiti Kebangsaan Malaysia 2023
Online Access:	http://journalarticle.ukm.my/21627/ http://journalarticle.ukm.my/21627/1/SD%2024.pdf

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