Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS)

This study aims to evaluate the effect of copper (Cu) substrate surface roughness on the intermetallic compound (IMC) growth and interfacial reaction of SAC305 lead-free solder joint after undergone an aging process. Aging process was conducted using high temperature storage (HTS) at temperature o...

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Main Authors: Rabiah Al Adawiyah Ab Rahim, Muhammad Nubli Zulkifli, Azman Jalar, Atiqah Mohd Afdzaluddin, Kim, Siow Shyong
Format: Article
Language:English
Published: Penerbit Universiti Kebangsaan Malaysia 2020
Online Access:http://journalarticle.ukm.my/16169/
http://journalarticle.ukm.my/16169/1/16.pdf
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author Rabiah Al Adawiyah Ab Rahim,
Muhammad Nubli Zulkifli,
Azman Jalar,
Atiqah Mohd Afdzaluddin,
Kim, Siow Shyong
author_facet Rabiah Al Adawiyah Ab Rahim,
Muhammad Nubli Zulkifli,
Azman Jalar,
Atiqah Mohd Afdzaluddin,
Kim, Siow Shyong
author_sort Rabiah Al Adawiyah Ab Rahim,
building UKM Institutional Repository
collection Online Access
description This study aims to evaluate the effect of copper (Cu) substrate surface roughness on the intermetallic compound (IMC) growth and interfacial reaction of SAC305 lead-free solder joint after undergone an aging process. Aging process was conducted using high temperature storage (HTS) at temperature of 150 °C and aging times of 200, 400, 600, 800, and 1000 h. IMC morphology and growth were examined using infinite focus microscope (IFM). Then, the SAC305 solder joint IMC growth kinetic was measured based on power law relationship and diffusion coefficient formula. It was noted that the morphology of IMC for the rougher Cu substrate has scallop-shaped and uniform layer as compared to that of smoother Cu substrate for the initial exposure to the HTS. In addition, Cu substrate with Ra of 579 nm is the turning point for the creation of Cu6 Sn5 towards more Cu3 Sn of IMC. In addition, Cu substrate with Ra of 579 nm also acts as the turning point for the IMC growth of SAC305 solder joint on Cu substrate for the solid-state diffusion to be happened during 150 °C of aging from grain boundary dominant toward volume diffusion dominant.
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spelling oai:generic.eprints.org:161692021-02-13T13:26:56Z http://journalarticle.ukm.my/16169/ Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS) Rabiah Al Adawiyah Ab Rahim, Muhammad Nubli Zulkifli, Azman Jalar, Atiqah Mohd Afdzaluddin, Kim, Siow Shyong This study aims to evaluate the effect of copper (Cu) substrate surface roughness on the intermetallic compound (IMC) growth and interfacial reaction of SAC305 lead-free solder joint after undergone an aging process. Aging process was conducted using high temperature storage (HTS) at temperature of 150 °C and aging times of 200, 400, 600, 800, and 1000 h. IMC morphology and growth were examined using infinite focus microscope (IFM). Then, the SAC305 solder joint IMC growth kinetic was measured based on power law relationship and diffusion coefficient formula. It was noted that the morphology of IMC for the rougher Cu substrate has scallop-shaped and uniform layer as compared to that of smoother Cu substrate for the initial exposure to the HTS. In addition, Cu substrate with Ra of 579 nm is the turning point for the creation of Cu6 Sn5 towards more Cu3 Sn of IMC. In addition, Cu substrate with Ra of 579 nm also acts as the turning point for the IMC growth of SAC305 solder joint on Cu substrate for the solid-state diffusion to be happened during 150 °C of aging from grain boundary dominant toward volume diffusion dominant. Penerbit Universiti Kebangsaan Malaysia 2020-12 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/16169/1/16.pdf Rabiah Al Adawiyah Ab Rahim, and Muhammad Nubli Zulkifli, and Azman Jalar, and Atiqah Mohd Afdzaluddin, and Kim, Siow Shyong (2020) Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS). Sains Malaysiana, 49 (12). pp. 3045-3054. ISSN 0126-6039 https://www.ukm.my/jsm/malay_journals/jilid49bil12_2020/KandunganJilid49Bil12_2020.html
spellingShingle Rabiah Al Adawiyah Ab Rahim,
Muhammad Nubli Zulkifli,
Azman Jalar,
Atiqah Mohd Afdzaluddin,
Kim, Siow Shyong
Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS)
title Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS)
title_full Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS)
title_fullStr Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS)
title_full_unstemmed Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS)
title_short Effect of isothermal aging and copper substrate roughness on the SAC305 solder joint intermetallic layer growth of high temperature storage (HTS)
title_sort effect of isothermal aging and copper substrate roughness on the sac305 solder joint intermetallic layer growth of high temperature storage (hts)
url http://journalarticle.ukm.my/16169/
http://journalarticle.ukm.my/16169/
http://journalarticle.ukm.my/16169/1/16.pdf