An extended abstract of "Metamorphic testing: testing the untestable"

This document is an extended abstract of an IEEE Software paper, "Metamorphic Testing: Testing the Untestable," presented as a J1C2 (Journal publication first, Conference presentation following) at the IEEE Computer Society signature conference on Computers, Software and Applications (COMP...

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Main Authors: Segura, Sergio, Towey, Dave, Zhou, Zhi Quan, Chen, T.Y.
Format: Conference or Workshop Item
Language:English
Published: 2019
Subjects:
Online Access:https://eprints.nottingham.ac.uk/60300/
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author Segura, Sergio
Towey, Dave
Zhou, Zhi Quan
Chen, T.Y.
author_facet Segura, Sergio
Towey, Dave
Zhou, Zhi Quan
Chen, T.Y.
author_sort Segura, Sergio
building Nottingham Research Data Repository
collection Online Access
description This document is an extended abstract of an IEEE Software paper, "Metamorphic Testing: Testing the Untestable," presented as a J1C2 (Journal publication first, Conference presentation following) at the IEEE Computer Society signature conference on Computers, Software and Applications (COMPSAC 2019), hosted by Marquette University, Milwaukee, Wisconsin, USA. © 2019 IEEE.
first_indexed 2025-11-14T20:40:34Z
format Conference or Workshop Item
id nottingham-60300
institution University of Nottingham Malaysia Campus
institution_category Local University
language English
last_indexed 2025-11-14T20:40:34Z
publishDate 2019
recordtype eprints
repository_type Digital Repository
spelling nottingham-603002020-04-13T01:53:02Z https://eprints.nottingham.ac.uk/60300/ An extended abstract of "Metamorphic testing: testing the untestable" Segura, Sergio Towey, Dave Zhou, Zhi Quan Chen, T.Y. This document is an extended abstract of an IEEE Software paper, "Metamorphic Testing: Testing the Untestable," presented as a J1C2 (Journal publication first, Conference presentation following) at the IEEE Computer Society signature conference on Computers, Software and Applications (COMPSAC 2019), hosted by Marquette University, Milwaukee, Wisconsin, USA. © 2019 IEEE. 2019-07-09 Conference or Workshop Item PeerReviewed application/pdf en cc_by https://eprints.nottingham.ac.uk/60300/1/3-merged.pdf Segura, Sergio, Towey, Dave, Zhou, Zhi Quan and Chen, T.Y. (2019) An extended abstract of "Metamorphic testing: testing the untestable". In: 43rd IEEE Annual Computer Software and Applications Conference, 15 July 2019 through 19 July 2019, Milwaukee; United States. Testing;Software;Conferences;Computer science;Machine learning;Software engineering http://dx.doi.org/10.1109/COMPSAC.2019.00037 10.1109/COMPSAC.2019.00037 10.1109/COMPSAC.2019.00037 10.1109/COMPSAC.2019.00037
spellingShingle Testing;Software;Conferences;Computer science;Machine learning;Software engineering
Segura, Sergio
Towey, Dave
Zhou, Zhi Quan
Chen, T.Y.
An extended abstract of "Metamorphic testing: testing the untestable"
title An extended abstract of "Metamorphic testing: testing the untestable"
title_full An extended abstract of "Metamorphic testing: testing the untestable"
title_fullStr An extended abstract of "Metamorphic testing: testing the untestable"
title_full_unstemmed An extended abstract of "Metamorphic testing: testing the untestable"
title_short An extended abstract of "Metamorphic testing: testing the untestable"
title_sort extended abstract of "metamorphic testing: testing the untestable"
topic Testing;Software;Conferences;Computer science;Machine learning;Software engineering
url https://eprints.nottingham.ac.uk/60300/
https://eprints.nottingham.ac.uk/60300/
https://eprints.nottingham.ac.uk/60300/