Structural modification of thin Bi(1 1 1) films by passivation and native oxide model

The structure of thin terminated Bi(1 1 1) films of approximately 1nm thickness is investigated from first principles. Our density functional theory calculations show that covalent bonds to the surface can change the orientation of the films completely. For thicker films, the effect is limited to th...

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Main Authors: König, Christian, Fahy, Stephen, Greer, James C.
Format: Article
Language:English
Published: American Physical Society 2019
Online Access:https://eprints.nottingham.ac.uk/57109/
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author König, Christian
Fahy, Stephen
Greer, James C.
author_facet König, Christian
Fahy, Stephen
Greer, James C.
author_sort König, Christian
building Nottingham Research Data Repository
collection Online Access
description The structure of thin terminated Bi(1 1 1) films of approximately 1nm thickness is investigated from first principles. Our density functional theory calculations show that covalent bonds to the surface can change the orientation of the films completely. For thicker films, the effect is limited to the surface only. Based on these observations, we further present a simple model structure for the native oxide and chemically similar oxides, which form a protective capping layer, leaving the orientation of the films unchanged. The advantages of this energetically favorable layered termination are discussed in the context of the films' technological exploitation in nanoelectronic devices.
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spelling nottingham-571092019-07-22T08:54:15Z https://eprints.nottingham.ac.uk/57109/ Structural modification of thin Bi(1 1 1) films by passivation and native oxide model König, Christian Fahy, Stephen Greer, James C. The structure of thin terminated Bi(1 1 1) films of approximately 1nm thickness is investigated from first principles. Our density functional theory calculations show that covalent bonds to the surface can change the orientation of the films completely. For thicker films, the effect is limited to the surface only. Based on these observations, we further present a simple model structure for the native oxide and chemically similar oxides, which form a protective capping layer, leaving the orientation of the films unchanged. The advantages of this energetically favorable layered termination are discussed in the context of the films' technological exploitation in nanoelectronic devices. American Physical Society 2019-06-10 Article PeerReviewed application/pdf en cc_by https://eprints.nottingham.ac.uk/57109/1/Structural%20modification%20of%20thin%20Bi%281%201%201%29%20films%20by%20passivation%20and%20native%20oxide%20model.pdf König, Christian, Fahy, Stephen and Greer, James C. (2019) Structural modification of thin Bi(1 1 1) films by passivation and native oxide model. Physical Review Materials, 3 (6). ISSN 2475-9953 http://dx.doi.org/10.1103/PhysRevMaterials.3.065002 doi:10.1103/PhysRevMaterials.3.065002 doi:10.1103/PhysRevMaterials.3.065002
spellingShingle König, Christian
Fahy, Stephen
Greer, James C.
Structural modification of thin Bi(1 1 1) films by passivation and native oxide model
title Structural modification of thin Bi(1 1 1) films by passivation and native oxide model
title_full Structural modification of thin Bi(1 1 1) films by passivation and native oxide model
title_fullStr Structural modification of thin Bi(1 1 1) films by passivation and native oxide model
title_full_unstemmed Structural modification of thin Bi(1 1 1) films by passivation and native oxide model
title_short Structural modification of thin Bi(1 1 1) films by passivation and native oxide model
title_sort structural modification of thin bi(1 1 1) films by passivation and native oxide model
url https://eprints.nottingham.ac.uk/57109/
https://eprints.nottingham.ac.uk/57109/
https://eprints.nottingham.ac.uk/57109/