APA (7th ed.) Citation

Thandauthapani, T. D., Reeve, A. J., Long, A. S., Turner, I. J., & Sharp, J. S. (2018). Exposing latent fingermarks on problematic metal surfaces using time of flight secondary ion mass spectroscopy. Elsevier.

Chicago Style (17th ed.) Citation

Thandauthapani, Tshaiya Devi, Adam J. Reeve, Adam S. Long, Ian J. Turner, and James S. Sharp. Exposing Latent Fingermarks on Problematic Metal Surfaces Using Time of Flight Secondary Ion Mass Spectroscopy. Elsevier, 2018.

MLA (9th ed.) Citation

Thandauthapani, Tshaiya Devi, et al. Exposing Latent Fingermarks on Problematic Metal Surfaces Using Time of Flight Secondary Ion Mass Spectroscopy. Elsevier, 2018.