APA (7th ed.) Citation

Chen, T. Y., Kuo, F., Ma, W., Susilo, W., Towey, D., Voas, J., & Zhou, Z. Q. (2016). Metamorphic testing for cybersecurity. Institute of Electrical and Electronics Engineers.

Chicago Style (17th ed.) Citation

Chen, Tsong Yueh, Fei-Ching Kuo, Wenjuan Ma, Willy Susilo, Dave Towey, Jeffrey Voas, and Zhi Quan Zhou. Metamorphic Testing for Cybersecurity. Institute of Electrical and Electronics Engineers, 2016.

MLA (9th ed.) Citation

Chen, Tsong Yueh, et al. Metamorphic Testing for Cybersecurity. Institute of Electrical and Electronics Engineers, 2016.