Feng, X., Su, R., Happonen, T., Liu, J., & Leach, R. (2018). Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing. Optical Society of America.
Chicago Style (17th ed.) CitationFeng, Xiaobing, Rong Su, Tuomas Happonen, Jian Liu, and Richard Leach. Fast and Cost-effective In-process Defect Inspection for Printed Electronics Based on Coherent Optical Processing. Optical Society of America, 2018.
MLA (9th ed.) CitationFeng, Xiaobing, et al. Fast and Cost-effective In-process Defect Inspection for Printed Electronics Based on Coherent Optical Processing. Optical Society of America, 2018.
Warning: These citations may not always be 100% accurate.