Near-field scanning and propagation of correlated low-frequency radiated emissions

Electromagnetic radiation from complex printed circuit boards can occur over a broad frequency bandwidth, ranging from hundreds of MHz to tens of GHz. This is becoming a critical issue for assessment of EMC and interoperability as electronic components become more and more integrated. We use emissio...

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Bibliographic Details
Main Authors: Gradoni, Gabriele, Madenoor Ramapriya, Deepthee, Creagh, Stephen C., Tanner, Gregor, Baharuddin, Mohd Hafiz, Nasser, Hayan, Smartt, Christopher, Thomas, David W.P.
Format: Article
Published: Institute of Electrical and Electronics Engineers 2017
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Online Access:https://eprints.nottingham.ac.uk/49194/
Description
Summary:Electromagnetic radiation from complex printed circuit boards can occur over a broad frequency bandwidth, ranging from hundreds of MHz to tens of GHz. This is becoming a critical issue for assessment of EMC and interoperability as electronic components become more and more integrated. We use emissions from an enclosure with a single-slot aperture and equipped with operating electronics to exemplify and model such sources. Spatial correlation functions obtained from two-probe measurements are used both to characterise the source and to propagate the emissions. We examine emissions in the submicrowave frequency range, where evanescent decay dominates the measured correlation function at the distances measured. We find that an approximate, diffusion-like propagator describes the measured emissions well. A phase-space approach based on Wigner functions is exploited to develop this approximation and to provide enhanced understanding of the emissions.